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Discover ELDIM’S new equipment for NIR sources characterization at Photonics West 2019

SAVE THE DATE: 5-7 February 2019

 

This year ELDIM will exhibit at Photonics West, we propose you two new systems in NIR characterization sources for quality control of LIDAR, VCSELs and other sources.

 

These two new products are ideal for 3D sensing technologies. It is used for application on self driving cars as well as for facial recognition for example.

 

We will present you on our booth a real time demonstration of our Near field solution. Our team will be there to give information on these two new product and discuss with you about your needs in order to find you a turnkey solution.

 

The exhibition will be held on the San Francisco Moscone center, USA from the 5 to the 7 of February 2019. We will be exhibiting in the France Pavilion, we are looking forward to welcoming you on this trade show ! We will be glad to meet you on our Booth #1059H.

 

Please contact us for more information.

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ELDIM at IS&T International Electronic Imaging 2019 Conference

This year once again Pierre BOHER from ELDIM company will present papers at IS&T International Electronic Imaging 2019.

 

The Electronic Imaging Symposium is a place where converge academic and industry people in the field of imaging and technologies.

 

This conference will be held at the Hyatt Regency San Francisco Airport, Burlingame, CA, USA from the 13rd to the 17th of January.

 

The two presentation will be present on Tuesday January 15, 2019. The first one start at 10:40 session Display & Color Constancy at Cypress B. The subject of this paper is viewing angle characterization of HDR/WCG displays using color volumes and new color spaces.

 

The second paper presentation will start at 12:10 at Cypress A on session Appearance Design and Computation. This subject of this presentation is Accurate physico-realistic ray tracing simulation of displays. Paper jointly written by Thierry Leroux, Pierre Boher from ELDIM and Thomas Muller, Philippe Porral from United Visual Researchers.

 

Hope you will enjoy this conference and paper presentation !

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Two new ELDIM’s systems VCProbe-NIR-STG & VCProbe-NIR-DSD

We are pleased to announce that ELDIM is launching two new products VCProbe-NIR-STG & VCProbe-NIR-DSD.

 

These new equipment are dedicated to NIR source characterization.

 

In a growing market of mature & innovative technologies, these two new systems will be a key point for all measurements on 3D sensing technologies such as VCSEL and LIDAR components. These systems allow high speed and accurate measurements for applications on R&D as well as mas production/QC.

 

VCProbe-NIR-STG is ideal to measure small aperture NIR sources. It’s a system optimized for individual VCSEL and has a Working Distance of 30mm. This system can measure all kind of sources such as LIDAR, Flash LIDAR, diode Laser and VCSEL on markets like self-driving cars. This system has an angular aperture of ±40° and an excellent angular resolution, it measures in real time a full map of any NIR source. VCProbe-NIR-STG is calibrated at a wavelength of 850nm, 905nm, 940nm.

 

VCProbe-NIR-DSD is mainly suitable to measure large aperture NIR sources. This equipment is designed to precisely measure characteristics of flood illuminators, stereoscopic imaging and structured light illumination components. It is used in particular for facial recognition (banking, phone application). This system allows a full map within a ±70° viewing angle cone, with a working distance of 4mm permitting non-contact measurement. VCProbe-NIR-DSD is calibrated at z wavelength of 940nm.

 

Product is standard and available as per datasheet specification for one unit. If a similar system is needed for a project or mass production, we can build a system working on customer specifications.

 

Please feel free to contact us on sales@eldim.fr if you have any questions or demand about VCProbe-NIR-STG and VCProbe-NIR-DSD.