February 25, 2019
Every year the ed Conference is held in Nuremberg in Germany, this year once again ELDIM will be participating to this event. The edC is one of the major forum were researchers and companies of the display industry go to present their latest publications.
The subject of the presentation presented by Pierre BOHER from ELDIM company will be : Characterization of NIR light sources for 3D Imaging using new Fourier optics viewing angle instrument.
This publication is related to our new systems for charaterization of NIR sources. VCProbe-NIR-DSD and VCProbe-NIR-STG, these two systems are ideal to measure VCSELs, LIDAR, flash LIDAR and DOE components. Components that are essentials to applications such as facial recognition and self driving cars.
The event will start on the 27th up to the 28th of February 2019. Pierre Boher from ELDIM company will present his presentation on the Wednesday, February 27 on Session 2 : Displays Measurements.
We hope you will enjoy this conference and this presentation !
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