We would like to thank you all, once again for visiting us during the Display Week 2019.
We were happy to meet you and present you our new products: the new model of EZLite-N has been featured. Also exposed the VCProbe series for Visible Range VIS and for Near InfraRed (NIR) with live demonstration on our booth.
During the exhibition we have the pleasure to welcome Tom Fiske from Microsoft company on our booth. Please go check on his article “Hot Takes on the Exhibit Floor” click here to read it.
On his article Tom FISKE points out that this year once again, we have welcome on our booth the french star-up United Visual Researchers UVR.
UVR create a software capable of physical realistic simulation based on accurate multispectral data, from measurements done by ELDIM’s equipment.
ELDIM is proud to have been able to give once again the opportunity to UVR to have an international presence.
We hope you had a great time like us.
SID Display Week 2019
Where the World’s Electronic Display Industry Meets
Location : San Jose McEnery Convention Center, San Jose, CA, USA
Booth : #728
Event Date : May 14-16, 2019
Conference Date and Time : Friday, May 17 / 10:40 AM- 12:00 PM / Room LL20A
Come to see us at our booth where we’ll be presenting a wide range of products that ensures you quality, reduce costs, and improve efficiencies.
We’ll be presenting some of our best equipment with live demos and workshops !
With our products, you will be able to have viewing angle luminance and color measurements with precise data allowing you to ensure premium quality checks of your products.
Come to our conference on High Resolution Optical Characterization of NIR Light Sources for 3D Imaging and we’ll introduce a new Fourier optics system dedicated to NIR viewing angle measurement.
SID’s annual Display Week is the world’s largest technical symposium and exhibition for the latest advances in electronic display technology.
Register now !
We hope that you had a good time, enjoyed the show and the different conferences.
Thank you for visiting us at our booth, we were glad to present you the new ELDIM Systems VCProbe-NIR and OFScope-NIR. Two news products dedicated to characterization of NIR sources.
Our team was there to show you a live demonstration of the new system VCProbe-NIR, ideal to measure small aperture NIR sources.
We appreciated the opportunity we had to meet you, we had the pleasure to have many discussions. Feel free to contact us for more information.
Thanks for your interest !